WI # 590001 - eMDT_UMTSLTE-UEConTest
General
Related
Name:
Test part: Enhancement of Minimization of Drive Tests for E-UTRAN and UTRAN
Acronym:
eMDT_UMTSLTE-UEConTest
Effective Acronym:
eMDT_UMTSLTE-UEConTest
WI Level:
Building Block (2nd level)
Type:
Work Item
Status:
PCG approved
Release:
Rel-11
Start date:
2013-03-04
End date:
2013-12-06
Remarks (1)
Creation date
Author
Remark
2015-01-22 12:40 UTC
RP#62 completed
Parent Work Item:
530033
- Enhancement of Minimization of Drive Tests for E-UTRAN and UTRAN
Child Work Items:
WI UID
WI name
No records to display.
Responsible group(s):
R5
Rapporteur(s):
Masahiro Tamaoki
(NTT DoCoMo)
Latest WID version:
RP-130172
TSG Approval meeting:
59
PCG Approval meeting:
30
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
Exit