WI # 590004 - COMP_LTE-UEConTest
General
Related
Name:
Test part: Coordinated Multi-Point Operation for LTE
Acronym:
COMP_LTE-UEConTest
Effective Acronym:
COMP_LTE-UEConTest
WI Level:
Building Block (2nd level)
Type:
Work Item
Status:
PCG approved
Release:
Rel-11
Start date:
2013-03-15
End date:
2014-12-15
Remarks (0)
Creation date
Author
Remark
No Remarks Added
Parent Work Item:
530032
- Coordinated Multi-Point Operation for LTE
Child Work Items:
WI UID
WI name
No records to display.
Responsible group(s):
R5
Rapporteur(s):
Samsung
Latest WID version:
RP-130376
TSG Approval meeting:
59
PCG Approval meeting:
30
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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