WI # 610024 - MBMS_LTE_OS
General
Related
Name:
Further MBMS operations support for E-UTRAN
Acronym:
MBMS_LTE_OS
Effective Acronym:
MBMS_LTE_OS
WI Level:
Feature (1st level)
Type:
Work Item
Status:
PCG approved
Release:
Rel-12
Start date:
2013-09-15
End date:
2014-12-15
Remarks (1)
Creation date
Author
Remark
2015-01-22 12:40 UTC
Solutions for Minimization of Drive Tests (MDT), in order to reduce the need for manual drive testing for MBMS.
Parent Work Item:
None
Child Work Items:
WI UID
WI name
610124
Core part: Further MBMS operations support for E-UTRAN
620073
Perf. part: Further MBMS operations support for E-UTRAN
Responsible group(s):
R1
,
R2
,
R3
,
R4
Rapporteur(s):
Yee Sin Chan
(Verizon)
Latest WID version:
RP-140282
TSG Approval meeting:
61
PCG Approval meeting:
31
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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