WI # 650027 - E_LTE_UED

Name:

Enhanced LTE UE Delay test methods and requirements

Acronym:

E_LTE_UED

Effective Acronym:

E_LTE_UED

WI Level:

Feature (1st level)

Type:

Work Item

Status:

PCG approved

Release:

Rel-13

Start date:

2014-09-09

End date:

2016-06-15

Remarks (9)

Creation date	Author	Remark


2016-06-14 07:32 UTC		11/6/16: 80%->100
2016-03-07 14:32 UTC		7/3/16: FCD: 03/16->06/16
2015-12-11 15:10 UTC		ES in SP-150652
2015-12-07 17:59 UTC		7/12/15: 50%->80, FCD: 12/15->03/16
2015-09-09 09:09 UTC		07/09/15: 15%->50
2015-08-14 09:55 UTC		Aug2015: 10%->15
2015-06-26 11:25 UTC		June2015: Compl:5%->10
2015-03-05 15:41 UTC		Mar. 15: 0->5%
2015-01-22 12:40 UTC		Enhance LTE UE delay test cases & reqs to support DTX & LTE radio optimizations (SPS, DRX), clock accuracy/behaviour of UEs in presence of clock drift, introduce jitter/loss profile condition, testing under H/O condition, MTSI serv over LTE with EVS codec

Parent Work Item:

None

Child Work Items:

WI UID	WI name


No records to display.

Responsible group(s):

Rapporteur(s):

Stephane Ragot (Orange)

Latest WID version:

SP-140482

TSG Approval meeting:

PCG Approval meeting:

TSG Stopped meeting:

PCG Stopped meeting:

See Specifications specifically resulting from this Work Item

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