WI # 710071 - LTE_extDRX-UEConTest

Name:

UE Conformance Test Aspects - RAN enhancements for extended DRX in LTE

Acronym:

LTE_extDRX-UEConTest

Effective Acronym:

LTE_extDRX-UEConTest

WI Level:

Building Block (2nd level)

Type:

Work Item

Status:

PCG approved

Release:

Rel-13

Start date:

2016-03-15

End date:

2016-09-15

Remarks (2)

Creation date	Author	Remark


2016-06-14 07:32 UTC		and CT1 feature eDRX-CT
2016-03-23 08:55 UTC		testing REL-13 LTE_extDRX-Core

Parent Work Item:

690005 - Extended DRX cycle for Power Consumption

Child Work Items:

WI UID	WI name


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Responsible group(s):

Rapporteur(s):

Qualcomm

Latest WID version:

RP-160602

TSG Approval meeting:

PCG Approval meeting:

TSG Stopped meeting:

PCG Stopped meeting:

See Specifications specifically resulting from this Work Item

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