WI # 721000 - LTE_eMDT2-UEConTest
Name: UE Conformance Test Aspects – Further Enhancements of Minimization of Drive Tests for E-UTRAN
Acronym: LTE_eMDT2-UEConTest
Effective Acronym: LTE_eMDT2-UEConTest
WI Level: Building Block (2nd level)
Type: Work Item
Status: PCG approved
Release: Rel-13
Start date: 2016-06-15
End date: 2017-03-15
Remarks (4)
Creation dateAuthorRemark
2017-03-22 10:25 UTC
21/3/17: Compl:5%->100%
2016-12-20 11:10 UTC
26/9/16: Com
2016-09-26 12:48 UTC
26/9/16: Com...
2016-07-08 14:39 UTC
tested REL-13 WI: LTE_eMDT2-Core
Parent Work Item: 690065 - Further Enhancements of Minimization of Drive Tests for E-UTRAN
Child Work Items:
WI UIDWI name
No records to display.
Responsible group(s): R5
Rapporteur(s): Intel
Latest WID version: RP-161071
TSG Approval meeting: 72
PCG Approval meeting: 37
TSG Stopped meeting: -
PCG Stopped meeting: -
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)