WI # 721000 - LTE_eMDT2-UEConTest

Name:

UE Conformance Test Aspects – Further Enhancements of Minimization of Drive Tests for E-UTRAN

Acronym:

LTE_eMDT2-UEConTest

Effective Acronym:

LTE_eMDT2-UEConTest

WI Level:

Building Block (2nd level)

Type:

Work Item

Status:

PCG approved

Release:

Rel-13

Start date:

2016-06-15

End date:

2017-03-15

Remarks (4)

Creation date	Author	Remark

Parent Work Item:

690065 - Further Enhancements of Minimization of Drive Tests for E-UTRAN

Child Work Items:

WI UID	WI name


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Responsible group(s):

Rapporteur(s):

Intel

Latest WID version:

RP-161071

TSG Approval meeting:

PCG Approval meeting:

TSG Stopped meeting:

PCG Stopped meeting:

See Specifications specifically resulting from this Work Item

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