WI # 1031086 - NR_IoT_NTN_req_test_enh-Core

Name:

Core part: Enhanced requirements and conductive test methodology for NR NTN and IoT NTN

Acronym:

NR_IoT_NTN_req_test_enh-Core

Effective Acronym:

NR_IoT_NTN_req_test_enh-Core

WI Level:

Building Block (2nd level)

Type:

Work Item

Status:

PCG approved

Release:

Rel-19

Start date:

End date:

Remarks (5)

Creation date	Author	Remark


2025-06-06 14:03 UTC		13/6/24: Stat Rep: ->RP-241280, , 4/9/24: FCD:09/09/2025->25/09/2024, Compl:0%->16%, Stat Rep: RP-241280->RP-241984, , 6/12/24: FCD:09/09/2024->09/09/2025, Compl:16%->50%, Stat Rep: RP-241984->RP-242592, , 6/3/25: FCD:23/03/2025->09/09/2025, Compl:50%->65
2025-03-06 15:24 UTC		6/3/25: FCD:23/03/2025->09/09/2025; Compl:50%->65
2024-12-06 14:34 UTC		6/12/24: FCD:09/09/2024->09/09/2025; Compl:16%->50%; Stat Rep: RP-241984->RP-242592;
2024-09-04 10:05 UTC		4/9/24: FCD:09/09/2025->25/09/2024; Compl:0%->16%; Stat Rep: RP-241280->RP-241984;
2024-06-13 13:04 UTC		13/6/24: Stat Rep: ->RP-241280;

Parent Work Item:

1030086 - Enhanced requirements and test methodology for NR NTN and IoT NTN

Child Work Items:

WI UID	WI name


No records to display.

Responsible group(s):

Rapporteur(s):

Samsung

Latest WID version:

RP-242901

TSG Approval meeting:

103

PCG Approval meeting:

TSG Stopped meeting:

PCG Stopped meeting:

See Specifications specifically resulting from this Work Item

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