WI # 1031086 - NR_IoT_NTN_req_test_enh-Core
Name: Core part: Enhanced requirements and conductive test methodology for NR NTN and IoT NTN
Acronym: NR_IoT_NTN_req_test_enh-Core
Effective Acronym: NR_IoT_NTN_req_test_enh-Core
WI Level: Building Block (2nd level)
Type: Work Item
Status: PCG approved
Release: Rel-19
Start date: 2024-03-03
End date: 2025-09-09
Remarks (4)
Creation dateAuthorRemark
2025-03-06 15:24 UTC
6/3/25: FCD:23/03/2025->09/09/2025; Compl:50%->65
2024-12-06 14:34 UTC
6/12/24: FCD:09/09/2024->09/09/2025; Compl:16%->50%; Stat Rep: RP-241984->RP-242592;
2024-09-04 10:05 UTC
4/9/24: FCD:09/09/2025->25/09/2024; Compl:0%->16%; Stat Rep: RP-241280->RP-241984;
2024-06-13 13:04 UTC
13/6/24: Stat Rep: ->RP-241280;
Parent Work Item: 1030086 - Enhanced requirements and test methodology for NR NTN and IoT NTN
Child Work Items:
WI UIDWI name
No records to display.
Responsible group(s): R4
Rapporteur(s): Samsung
Latest WID version: RP-242901
TSG Approval meeting: 103
PCG Approval meeting: 52
TSG Stopped meeting: -
PCG Stopped meeting: -
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)