WI # 1030086 - NR_IoT_NTN_req_test_enh
General
Related
Name:
Enhanced requirements and test methodology for NR NTN and IoT NTN
Acronym:
NR_IoT_NTN_req_test_enh
Effective Acronym:
NR_IoT_NTN_req_test_enh
WI Level:
Feature (1st level)
Type:
Work Item
Status:
PCG approved
Release:
Rel-19
Start date:
2024-03-03
End date:
2025-03-03
Remarks (2)
Creation date
Author
Remark
2024-09-26 14:25 UTC
26/9/24: WID:RP-241281->RP-241985
2024-07-23 13:36 UTC
23/7/24: WID:RP-240857->RP-241281
Parent Work Item:
None
Child Work Items:
WI UID
WI name
1031086
Core part: Enhanced requirements and conductive test methodology for NR NTN and IoT NTN
1032086
Perf. Part: Enhanced requirements and conductive test methodology for NR NTN and IoT NTN
Responsible group(s):
R4
Rapporteur(s):
Samsung
Latest WID version:
RP-241985
TSG Approval meeting:
103
PCG Approval meeting:
52
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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