WI # 1030086 - NR_IoT_NTN_req_test_enh
General
Related
Name:
Enhanced requirements and test methodology for NR NTN and IoT NTN
Acronym:
NR_IoT_NTN_req_test_enh
Effective Acronym:
NR_IoT_NTN_req_test_enh
WI Level:
Feature (1st level)
Type:
Work Item
Status:
Awaiting approval
Release:
Rel-19
Start date:
2024-03-03
End date:
2026-03-03
Remarks (0)
Creation date
Author
Remark
No Remarks Added
Parent Work Item:
None
Child Work Items:
WI UID
WI name
1031086
Core part: Enhanced requirements and conductive test methodology for NR NTN and IoT NTN
1032086
Perf. Part: Enhanced requirements and conductive test methodology for NR NTN and IoT NTN
Responsible group(s):
R4
Rapporteur(s):
Samsung
Latest WID version:
RP-240857
TSG Approval meeting:
-
PCG Approval meeting:
-
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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