WI # 1032086 - NR_IoT_NTN_req_test_enh-Perf
Name: Perf. Part: Enhanced requirements and conductive test methodology for NR NTN and IoT NTN
Acronym: NR_IoT_NTN_req_test_enh-Perf
Effective Acronym: NR_IoT_NTN_req_test_enh-Perf
WI Level: Building Block (2nd level)
Type: Work Item
Status: PCG approved
Release: Rel-19
Start date: 2024-03-03
End date: 2026-03-03
Remarks (4)
Creation dateAuthorRemark
2025-03-06 15:24 UTC
6/3/25: FCD:22/07/2025->03/03/2026; Compl:30%->35
2024-12-06 14:34 UTC
6/12/24: FCD:03/03/2025->03/03/2026; Compl:10%->30%; Stat Rep: RP-241984->RP-242592;
2024-09-04 10:05 UTC
4/9/24: FCD:03/03/2026->26/03/2025; Compl:0%->10%; Stat Rep: RP-241280->RP-241984;
2024-06-13 13:04 UTC
13/6/24: Stat Rep: ->RP-241280;
Parent Work Item: 1030086 - Enhanced requirements and test methodology for NR NTN and IoT NTN
Child Work Items:
WI UIDWI name
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Responsible group(s): R4
Rapporteur(s): Samsung
Latest WID version: RP-242901
TSG Approval meeting: 103
PCG Approval meeting: 52
TSG Stopped meeting: -
PCG Stopped meeting: -
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See all related Change Requests related to this Work Item (all specifications)
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