WI # 1032086 - NR_IoT_NTN_req_test_enh-Perf

Name:

Perf. Part: Enhanced requirements and conductive test methodology for NR NTN and IoT NTN

Acronym:

NR_IoT_NTN_req_test_enh-Perf

Effective Acronym:

NR_IoT_NTN_req_test_enh-Perf

WI Level:

Building Block (2nd level)

Type:

Work Item

Status:

PCG approved

Release:

Rel-19

Start date:

2024-03-03

End date:

2026-03-03

Remarks (5)

Creation date	Author	Remark


2025-06-06 14:03 UTC		13/6/24: Stat Rep: ->RP-241280, , 4/9/24: FCD:03/03/2026->26/03/2025, Compl:0%->10%, Stat Rep: RP-241280->RP-241984, , 6/12/24: FCD:03/03/2025->03/03/2026, Compl:10%->30%, Stat Rep: RP-241984->RP-242592, , 6/3/25: FCD:22/07/2025->03/03/2026, Compl:30%->35
2025-03-06 15:24 UTC		6/3/25: FCD:22/07/2025->03/03/2026; Compl:30%->35
2024-12-06 14:34 UTC		6/12/24: FCD:03/03/2025->03/03/2026; Compl:10%->30%; Stat Rep: RP-241984->RP-242592;
2024-09-04 10:05 UTC		4/9/24: FCD:03/03/2026->26/03/2025; Compl:0%->10%; Stat Rep: RP-241280->RP-241984;
2024-06-13 13:04 UTC		13/6/24: Stat Rep: ->RP-241280;

Parent Work Item:

1030086 - Enhanced requirements and test methodology for NR NTN and IoT NTN

Child Work Items:

WI UID	WI name


No records to display.

Responsible group(s):

Rapporteur(s):

Samsung

Latest WID version:

RP-252076

TSG Approval meeting:

103

PCG Approval meeting:

TSG Stopped meeting:

PCG Stopped meeting:

See Specifications specifically resulting from this Work Item

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