WI # 2562

Name:

Deleted - Testing Layer 2 and layer 3 protocol aspects - TTCN

Acronym:

Effective Acronym:

WI Level:

Work Task (3rd Level)

Type:

Work Item

Status:

TSG stopped

Release:

Rel-4

Start date:

2002-12-03

End date:

2003-12-02

Remarks (1)

Creation date	Author	Remark


2015-01-22 12:41 UTC		Marked as stopped 12/2008

Parent Work Item:

2103 - Conformance Test Aspects - Low Chip Rate TDD

Child Work Items:

WI UID	WI name


No records to display.

Responsible group(s):

Rapporteur(s):

Latest WID version:

TP-030052

TSG Approval meeting:

PCG Approval meeting:

TSG Stopped meeting:

TP-22

PCG Stopped meeting:

See Specifications specifically resulting from this Work Item

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