WI # 2562
Name: Deleted - Testing Layer 2 and layer 3 protocol aspects - TTCN
Acronym:
Effective Acronym:
WI Level: Work Task (3rd Level)
Type: Work Item
Status: TSG stopped
Release: Rel-4
Start date: 2002-12-03
End date: 2003-12-02
Remarks (1)
Creation dateAuthorRemark
2015-01-22 12:41 UTC
Marked as stopped 12/2008
Parent Work Item: 2103 - Conformance Test Aspects - Low Chip Rate TDD
Child Work Items:
WI UIDWI name
No records to display.
Responsible group(s): T1
Rapporteur(s):
Latest WID version: TP-030052
TSG Approval meeting: -
PCG Approval meeting: -
TSG Stopped meeting: TP-22
PCG Stopped meeting: -
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)