WI # 460003 - MDT_UMTSLTE

Name:

Minimization of Drive Tests for E-UTRAN and UTRAN

Acronym:

MDT_UMTSLTE

Effective Acronym:

MDT_UMTSLTE

WI Level:

Feature (1st level)

Type:

Work Item

Status:

PCG approved

Release:

Rel-10

Start date:

2009-12-04

End date:

2013-03-01

Remarks (1)

Creation date	Author	Remark


2015-01-22 12:40 UTC		Triggered by UID_430021 TR 36.805 (Study on Minimization of drive-tests in NGN)

Parent Work Item:

None

Child Work Items:

WI UID	WI name


460103	Core part: Minimization of Drive Tests for E-UTRAN and UTRAN
530041	Test part: Minimization of Drive Tests for E-UTRAN

Responsible group(s):

R2 , R3 , R4 , R5

Rapporteur(s):

Nokia Siemens Networks

Latest WID version:

RP-100360

TSG Approval meeting:

PCG Approval meeting:

TSG Stopped meeting:

PCG Stopped meeting:

See Specifications specifically resulting from this Work Item

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