WI # 530041 - MDT_UMTSLTE-UEConTest
General
Related
Name:
Test part: Minimization of Drive Tests for E-UTRAN
Acronym:
MDT_UMTSLTE-UEConTest
Effective Acronym:
MDT_UMTSLTE-UEConTest
WI Level:
Building Block (2nd level)
Type:
Work Item
Status:
PCG approved
Release:
Rel-10
Start date:
2011-09-19
End date:
2013-03-01
Remarks (1)
Creation date
Author
Remark
2015-01-22 12:40 UTC
RP#59 completed. Testing for LTE only
Parent Work Item:
460003
- Minimization of Drive Tests for E-UTRAN and UTRAN
Child Work Items:
WI UID
WI name
No records to display.
Responsible group(s):
R5
Rapporteur(s):
Leif Mattisson
(Ericsson)
Latest WID version:
RP-120598
TSG Approval meeting:
53
PCG Approval meeting:
27
TSG Stopped meeting:
-
PCG Stopped meeting:
-
See Specifications specifically resulting from this Work Item
See all related Change Requests related to this Work Item (all specifications)
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